You can display information labels for simulated diffraction peaks, in order to emphasize their locations, Miller Indices, d-spacings, or other data. CrystalDiffract lets you control how many labels are displayed, either by specifying a minimum intensity threshold (below which peaks will not be labelled), or by opting to hide any (weaker) overlapping labels.
Do the following:
Select the pattern to label.
Choose: Pattern > Show Labels.
Do the following:
Select the pattern(s) to label.
Choose: Pattern > Label Threshold and select a higher threshold value (to label fewer peaks), or a lower value (to label more peaks).
Enable the Hide Overlapping Labels option in the Labels group of the Format Inspector.
Do the following:
Select the pattern(s) to label.
Choose: Pattern > Label Content and select which items should be shown in the label.
Do the following:
Select the pattern(s) to label.
Show the Format List by clicking the Inspector button in the toolbar, or by choosing: View > Layout > Show Inspector.
Open the Labels Group to reveal controls for setting the label colour, position, style, threshold and content.
Note: Displaying many peak labels will increase the time taken to plot. For best results, choose a high threshold, so that only the most-intense peaks are labelled, or use the Hide Overlapping Peaks option to suppress any (weaker) labels.
See Also